This equipment is used to facilitate quick detection of foreign substances adhering to the upper reticle surface and the lower pellicle surface of the reticles for exposure systems.
Presents visual inspection systems for wafers and masks as well as circuits and glass surfaces for flexible printed substrates
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This equipment is used to facilitate quick detection of foreign substances adhering to the upper reticle surface and the lower pellicle surface of the reticles for exposure systems. |
This light source system allows standardized component units to be assembled according to the purpose. |