Introduction to Ushio's Laboratories and Facilities

In this analysis method, soft X-rays are irradiated onto the solid surface of test specimens in a vacuum, and the kinetic energy of the photoelectrons emitted from the surface as a result of photoelectric effect is measured. Data on atoms and molecules that form layers close to the surface of the solid can be obtained.

A thin electron beam several nanometers wide irradiated onto test specimens is scanned and the secondary electrons generated are detected, thereby enabling various objects to be magnified for viewing. The resolution is incomparably higher than that of optical microscopes.

This is a type of scanning electron microscope (SEM) with a field-emission electron gun. Its resolution is higher than that of an ordinary SEM.

A thin electron beam is irradiated onto test specimens, and the characteristic X-ray emitted from the specimen is detected, enabling an analysis of the type of atom, distribution, density and other attributes.

This equipment measures the spectral transmission factor and spectral reflection factor in the vacuum ultraviolet region.

This is an analyzer for structural (qualitative) estimation mainly of organic compounds. When infrared rays are irradiated on molecules, the infrared rays corresponding to the vibratory energy of the atoms that constitute the molecules are absorbed. The structure of compounds can thereby be estimated and the quantity determined by investigating the degree of absorption.

This equipment measures the spectral transmission and reflection factors in the region of visible light.

Molecules are converted into ions, and the ions are separated according to the charge/mass ratio to enable analysis of the gas composition. The equipment is effective in analyzing the composition of complicated gases.

The test specimen is irradiated with a beam of X-rays to analyze the crystalline structure and properties based on the diffraction data.

The specimen solution sent into inductivity-coupled plasma is made to emit light, and the quantity and quality of ultratrace element are determined through spectroanalysis.

The equipment uses the phenomenon in which atoms absorb light from unique wavelengths. (Resonance absorption of atoms.) When the atomized test specimen is incinerated, the metal and other atoms are released. Light with a wavelength that is unique to the atom is made to pass through the spectrometer to measure the degree of absorption and to determine the quantity of ultratrace atoms.

Ion analysis is performed efficiently, selectively and at a high level of sensitivity, by measuring the dielectric constant of ion factors contained in the ultratrace elements of the solution. The highly sensitive analysis of ionic substances is also possible.