Near‑infrared spectroscopy of low‑transmittance samples by a high‑power time‑stretch spectrometer using an arrayed waveguide grating (AWG)

 

　Ushio has developed a high-power time-stretch spectroscopy method capable of the high-speed measurement of low-transmittance, highly scattering materials in milliseconds. We achieved ten times higher output power than conventional broadband time-stretch spectrometer by using arrayed waveguide gratings (AWGs) to avoid unwanted nonlinear effect. Our setup simultaneously realizes high intensity, broad wavelength range (900-1300 nm), and high-speed measurements (spectrum acquisition rate of 1.2 MHz at a maximum).
We have evaluated the performance of the developed spectrometer with NIR absorption standard reference material of NIST. Even with reduced light source intensity to simulate low-transmittance sample measurements, we accurately measured the absorption spectra of standard material with high precision in sub-millisecond. The developed method is expected to significantly contribute to the full inspection of mass-produced items.




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